CDF Silicon Monitoring
We have been active in the ongoing monitoring of CDF's silicon data.
Each new run is automatically processed offline to identify and monitor problems. Results are displayed in several web based reports:
- ADCMon
plots distributions of strip charge and clusters for each detector module.
- A graphical error history
is maintained.
- errorMon
displays detailed information about data corruption problems in each run.
- ReadoutMon
displays plots of the readout time for each sub-detector in the most recent run.
- NoiseScan
displays plots of the noise vs bias voltage obtained from periodic bias voltage scans. These are used to monitor the effect of radiation damage, e.g., leading to type inversion.